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Detection of a piezoelectric effect in thin films of thermally grown SiO2 via lock-in ellipsometry
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10.1063/1.4731287
/content/aip/journal/apl/100/26/10.1063/1.4731287
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/26/10.1063/1.4731287
/content/aip/journal/apl/100/26/10.1063/1.4731287
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/content/aip/journal/apl/100/26/10.1063/1.4731287
2012-06-26
2014-11-27
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Detection of a piezoelectric effect in thin films of thermally grown SiO2via lock-in ellipsometry
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/26/10.1063/1.4731287
10.1063/1.4731287
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