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(Color online) Φ—scan x-ray diffraction patterns of (a) STO50nm deposited on MgO(001) and (b) CGO250nm deposited on MgO(001)/STO50nm. Out-of-plane lattice constants and strain in (c) STO buffer layers deposited on MgO(001) and (d) CGO250nm deposited on MgO(001)/STO10/20/50nm. Dotted lines are a guide to the eye.
(Color online) (a) and (b) are Nyquist plots whilst (c) and (d) represent frequency dependence of imaginary part of impedance measured at 400 °C for MgO(001)/CGO250nm and MgO(001)/STO10/20/50 nm/CGO250nm films, respectively. Inset in (d) shows the electrode arrangement used for in-plane conductivity measurements.
(Color online) (a) Conductivity vs. temperature plots for CGO250nm films deposited on MgO(001) and MgO(001)/STO10/20/50nm substrates. Dotted lines in figure correspond to a linear fit. (b) Conductivity vs. strain induced in CGO films measured at different temperatures. Dotted lines are a guide to the eye.
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