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Gallium-droplet behaviors of self-catalyzed GaAs nanowires: A transmission electron microscopy study
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10.1063/1.3678185
/content/aip/journal/apl/100/3/10.1063/1.3678185
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/3/10.1063/1.3678185
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Figures

Image of FIG. 1.
FIG. 1.

Microstructural evolution at the top area of the GaAs NWs grown by supplying the As flux of 1.2 × 10−6 Torr during the cooling-down process. (a) BFTEM image; (b) HRTEM micrograph; (c) and (d) Enlarged HRTEM micrographs; (c) Phase transition region (PTR); (d) ZB/WZ interface; (e) and (f) Diffractogram by a fast-Fourier transform (FFT) in R1 and R2 regions in (b). The arrows in (a), (b), and (d) indicate the final transition from a WZ structure to a ZB structure, just before finishing the growth.

Image of FIG. 2.
FIG. 2.

Microstructural evolution at the top area of the GaAs NWs grown by supplying the As flux of 3.46 × 10−7 Torr during the cooling-down process. (a) BFTEM image; (b) HRTEM micrograph; (c) Enlarged HRTEM micrographs; (d), (e), and (f) Diffractogram by a fast-Fourier transform (FFT) taken from R1, R2, and R3 regions in (b). The arrows in (a), (b), and (c) indicate the final transition from a WZ structure to a ZB structure, just before finishing the growth.

Image of FIG. 3.
FIG. 3.

(Color online) Microstructural evolution at the top area of the GaAs NWs grown by shutting off the valve for the supply of the As precursor during the cooling-down process. (a) BFTEM image; (b) Schematic diagram of the NW; (c) Enlarged HRTEM micrographs of the Ga/GaAs interface, top: center, bottom: edge; (d) Plots of the diameter of the Ga droplets, DD, and the contact angle θC, as a function of the diameter of the GaAs NWs, DNW. The straight lines are the linear fit; (e) and (f) Ga droplet-free GaAs NWs, less than 46 nm in diameter.

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/content/aip/journal/apl/100/3/10.1063/1.3678185
2012-01-20
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Gallium-droplet behaviors of self-catalyzed GaAs nanowires: A transmission electron microscopy study
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/3/10.1063/1.3678185
10.1063/1.3678185
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