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(Color online) (a) SEM micrograph of a cantilever with an interferometric high-bandwidth force sensor. (b) Every other finger in this grating is connected to the tip, effectively forming a smaller secondary cantilever that has a higher resonance frequency than the main cantilever beam. The tip-coupled fingers move under impulsive surface forces, while the other fingers remain stationary. The displacement is differentially measured by monitoring the intensity of diffracted orders and is used to calculate tip-sample interaction forces.
(Color online) (a) Schematic of the experimental set up. The AFM feedback loop is set on the flexural displacement of the cantilever and is used to obtain the topography and phase images. Both cantilever and force sensor displacement signals are sampled into an external computer and are used to calculate the sample elastic modulus and adhesion forces. (b) Block diagram of signal processing used to calculate the interaction forces and the reduced elastic modulus.
(Color online) AFM images of PS/LLDPE blend. The 512 × 512 pixel images were acquired in 1024 s. (a) Topography image, (b) phase image, (c) reduced elastic modulus map, (d) peak adhesion force map, (e) topography data, (f) phase data, (g) reduced elastic modulus data, and (h) peak adhesion force data. All images/data are recorded simultaneously. (i) Histogram data for the reduced elastic modulus measurements on PS/LLDPE polymer sample in (c). The two polymers are clearly differentiated.
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