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Pulsed contact resonance for atomic force microscopy nanomechanical measurements
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10.1063/1.3680212
/content/aip/journal/apl/100/5/10.1063/1.3680212
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/5/10.1063/1.3680212
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) (a) Schematic of experimental setup. (b) Point contact resonance spectra on epoxy and Si regions of the experimental sample. f LI1 and f LI2 indicate the CR drive and detection frequencies.

Image of FIG. 2.
FIG. 2.

(Color online) Measured and calculated signals from pCR operation at a stationary x-y position on (a) 〈001〉 Si and (b) epoxy. From top to bottom, the plots show z-piezo position Z; cantilever deflection force F; amplitudes A 1 and A 2 at CR drive/detect frequencies f LI1 and f LI2; phases ϕ 1 and ϕ 2 at f LI1 and f LI2; and calculated CR frequency f CR and quality factor Q.

Image of FIG. 3.
FIG. 3.

(Color online) (a) Topographic image of sample, where the red line indicates the location of the data in (b)-(d). Results obtained while scanning the sample in pCR mode: (b) CR frequency f CR and (c) quality factor Q for 28 nN applied force, (d) adhesion force F adh, and (e) force-distance slope dF/dZ.

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/content/aip/journal/apl/100/5/10.1063/1.3680212
2012-01-30
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Pulsed contact resonance for atomic force microscopy nanomechanical measurements
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/5/10.1063/1.3680212
10.1063/1.3680212
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