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Well-to-well non-uniformity in InGaN/GaN multiple quantum wells characterized by capacitance-voltage measurement with additional laser illumination
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10.1063/1.3685717
/content/aip/journal/apl/100/7/10.1063/1.3685717
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/7/10.1063/1.3685717
/content/aip/journal/apl/100/7/10.1063/1.3685717
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/content/aip/journal/apl/100/7/10.1063/1.3685717
2012-02-16
2014-12-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Well-to-well non-uniformity in InGaN/GaN multiple quantum wells characterized by capacitance-voltage measurement with additional laser illumination
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/7/10.1063/1.3685717
10.1063/1.3685717
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