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Thermoelectric properties and structural variations in Bi2Te3−xSx crystals
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Image of FIG. 1.
FIG. 1.

Bi2Te3−xSx crystal with labels of the locations where the three small single crystals (I, IIa, and III) were cut for the structural studies. Three slices were cut (I, IIb, and III) for Hall measurements.

Image of FIG. 2.
FIG. 2.

(Color online) Schematic of the screening probe used for measuring electrical conductivity and Seebeck coefficient.

Image of FIG. 3.
FIG. 3.

(Color online) Crystal structure of Bi2Te3−xSx (showing groups of quintuple-layer of Te1(S)-Bi-S2-Bi-Te1(S)) on the left and of Bi2Te3 on the right. The position of the van der Waals planes (arrows) are illustrated.

Image of FIG. 4.
FIG. 4.

Seebeck coefficient and carrier concentration of the Bi2Te3−xSx crystal as a function of the distance along the 4.5 cm axis.


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Table I.

Seebeck coefficient as a function of distance along the long-axis of the crystal (positions indicated are in the unit of mm from location I). The standard deviation was calculated with 20 measurements per each position.

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Table II.

Crystallographic data for Bi2Te3−xSx (space group R m, and Z= 3).

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Table III.

Shortest interatomic distances (Å) in the Bi2Te3−xSx crystals. The Te1 site in Bi2Te3−xSx has 21% S in (I), 23% S in (II) and 24% S in (III).


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Thermoelectric properties and structural variations in Bi2Te3−xSx crystals