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Measuring the concentration and energy distribution of interface states using a non-contact corona oxide semiconductor method
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10.1063/1.3689004
/content/aip/journal/apl/100/8/10.1063/1.3689004
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/8/10.1063/1.3689004
/content/aip/journal/apl/100/8/10.1063/1.3689004
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/content/aip/journal/apl/100/8/10.1063/1.3689004
2012-02-24
2014-09-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Measuring the concentration and energy distribution of interface states using a non-contact corona oxide semiconductor method
http://aip.metastore.ingenta.com/content/aip/journal/apl/100/8/10.1063/1.3689004
10.1063/1.3689004
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