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(Color online) (a) Schematic view of the grating with a TM polarized incident field. (b) Scanning electron microscope images of the fabricated n-GaAs grating.
(Color online) Experimental reflectivity spectra of the sample (flat surface and grating) measured at various angles of incidence in TM and TE polarization.
(Color online) Comparison of the measured reflectivity of the GaAs grating ( = 45°, TM polarized) with the theoretical reflectivity obtained with three models: (a) walls uniformly filled with electrons, (b) fully depeleted walls, and (c) “core-shell” model.
Real part of the electric field along the x direction at 35.3 μm for = 45° and TM-polarization. One period is shown. The black line indicates the surface of the grating.
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