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The FMR linewidth (HWHM) as a function of microwave frequency. The solid lines were obtained by linear fits to the data points. The circular symbols and straight line correspond to the single magnetic layer sample S3: 9YIG(etched)/6.1Au. The square symbols and straight line correspond to the double magnetic layer S4: 9YIG/6.1Au/4.3Fe/6.1Au.
The Fe 2 p3/2 and O 1 s XPS peaks for bare YIG before and after etching 0.8 keV for 10 min. (a) and (c) represent XPS spectra before etching. (b) and (d) represent the same spectra after etching. Note that after etching the higher binding energy of Fe, = 714.6 eV, moved towards lower binding energy by 0.4 eV and their intensities became closer. For O line, the higher binding energy moved toward the lower binding energy by 0.3 eV, but its intensity somewhat decreased.
Magnetic parameters for the measured samples. S1: 9YIG(untreated). S2: S1/8.1Au. S3: 9YIG (Ar+ ion beam etched at 0.8 kV for 10 min at 400 °C)/6.1Au. S4: S3/4.3Fe/6.1Au. S5:, 9YIG (etched at 1 kV for 22 min at 400 °C)/6.1Au/4.3Fe/6.1Au. S6: 9YIG (etched at 1 kV for 28 min at 400 °C)/6.1Au/4.3Fe/6.1Au. The numerals in structures are the layer thickness in nm.
XPS data for Fe 2p3/2 and O 1s peaks for samples in Fig. 2. and are the binding energies for peaks 1 and 2 and and are their corresponding relative intensities.
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