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(Color online) (a) In-plane piezoelectric response of 60-nm-thick Ni/PMN-PT (001) sample and (b) AFM and MFM images of 60-nm-thick Ni thin film on PMN-PT (001) substrate. (I) 0 MV/m, (II) 0.4 MV/m, (III) 0.8 MV/m, and (IV) 0 MV/m. Inset in (a): Illustration of 60-nm-thick Ni/PMN-PT (001) in the MFM experiment. Arrow signs in (IV) point out the domain wall pinning positions.
(Color online) Normalized Kerr rotation hysteresis curves of 60-nm-thick Ni thin film on PMN-PT (001): (a) Polar mode and (b) Longitudinal mode. Inset in (a): Approximate Ha values at different electric fields.
(Color online) 2-D schematic diagrams of flux closure domain configuration in the cross-section of 60-nm-thick Ni thin film MFM images: (a) zero strain at 0 MV/m and (b) isotropic in-plane compressive strain at 0.8 MV/m. White lines on MFM images represent possible cross-section positions. Gray arrows represent the magnetization direction of each domain: “out-of-plane domains” have arrows pointing to the  directions and “in-plane domains” have arrows parallel to the x axis. N and S represent the polarity of stray fields exiting the sample surface.
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