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The effect of interfaces on magnetic activation volumes in single crystal Co2FeSi Heusler alloy thin films
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10.1063/1.4749822
/content/aip/journal/apl/101/10/10.1063/1.4749822
http://aip.metastore.ingenta.com/content/aip/journal/apl/101/10/10.1063/1.4749822

Figures

Image of FIG. 1.
FIG. 1.

Normalised M-H hysteresis loops for as-deposited (solid line), 500 °C annealed (dashed line), and 600 °C annealed (dashed and dotted line) Co2FeSi thin films.

Image of FIG. 2.
FIG. 2.

(a) XRD 2θ-ω out of plane scans for as-deposited and annealed samples. (b) XRD φ (111) plane scans for as deposited and annealed samples.

Image of FIG. 3.
FIG. 3.

(a) Unfiltered HAADF STEM cross section image of the film structure for the sample annealed at 600 °C. (b) High resolution HAADF STEM image of the film showing the atomic structure. Insets show in-plane and out-of-plane intensity profiles allowing atomic identification.

Image of FIG. 4.
FIG. 4.

(a) Weak-beam dark-field image of MgO/Co2FeSi interface showing. (b) Stress map of HAADF STEM image of the same region highlights dislocation cores at the interface.

Tables

Generic image for table
Table I.

Comparison of physical grain size (D XRD) and defect spacing (D Defect) with magnetic activation diameter (D act).

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/content/aip/journal/apl/101/10/10.1063/1.4749822
2012-09-07
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: The effect of interfaces on magnetic activation volumes in single crystal Co2FeSi Heusler alloy thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/101/10/10.1063/1.4749822
10.1063/1.4749822
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