Full text loading...
(a) CCD image of the Bragg peak of 6 u.c. SrTiO3 on Si, obtained using synchrotron x-ray diffraction. The width of the SrTiO3 Bragg peak in the in-plane direction is the same width as that of the Si substrate. (b) Ex situ atomic force micrograph of an as-grown film of SrTiO SrTiO3 on Si, 6 u.c. thick with unit-cell rms roughness = 0.36 nm (z-range = 2.7 nm). (c) RHEED image obtained along the SrTiO3〈100〉 direction after growth of a 6 u.c. thick sample of SrTiO3 on Si grown using MBE.
PFM imaging at a frequency near the mechanical tip resonance. (a) Schematic of applied poling voltages. (b) PFM image of the amplitude response from a 6 u.c. SrTiO3 film epitaxially grown on Si after following poling with 3 V in the bright regions and −3V in the dark regions. (c) Phase response collected simultaneously with the amplitude.
(a) A band excitation frequency map of the amplitude of the piezoresponse from PZT as a function of applied dc voltage, which is shown in (e). The most intense amplitude response in (a) is visible as a red line, while blue indicates minimal amplitude response. Correspondingly, the phase of the piezoresponse from PZT is shown in (c), plotted as a function of excitation frequency and applied voltage. In (c), the phase difference for PZT between blue and red is approximately π radians. The amplitude response from 6 u.c. SrTiO3 on Si is shown in (b) as a function of excitation frequency and applied voltage (f). The amplitude at resonance decreases by approximately 40% (red to yellow) as a function of the applied voltage. The phase response from SrTiO3 shown in (d) has no variation in phase as a function of applied voltage.
Article metrics loading...