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(a) Schematic of cross-section TEM micrograph of an S-LEO a-plane GaN film, and (b) Schematic of (c)–(i) BF plan-view TEM micrographs under a series of two-beam diffraction conditions.
Projections of atomic configurations along c-direction for (a) the Amelinckx PSF, (b) the Drum PSF, and (c) simplified Northrup PSF. (d) HAADF-STEM image viewed along the c-direction for the PSF and (e) enlarged image of the PSF enclosed by the white rectangle in (d).
Trace analysis for the PSFs (Amelinckx, Drum, simplified Northrup) and associated BSFs.
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