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Room temperature XRD θ-2θ of films S1-S3 grown on different substrates. The inset shows the microstructure of the cross-section of the PZNT/LNO/Si films.
Scaling of hysteresis for PZNT films on different substrates: variation in hysteresis loops of AFE films (a) PZNT/LNO/Si films, respectively (S1), (b) PZNT/Pt/Si (S2), (c) PZNT/LSCO/Si (S3), as a function of frequency. (d) The relation of log(W) against log(f) for the saturated hysteresis loops.
Dependence of energy density W on field amplitude E0 at 100 Hz.
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