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(a) A typical contact-mode AFM topography image of a GONR, the height measurement details shown in the inset, the height indicates a stack of ∼7 layers. (b) A characteristic SEM image of a GONR stack on a SiO2 surface.
(a) High-resolution XPS spectra of N-GNRs, (b) K-GNRs, and (c) GONRs; the top inset in (c) is the XPS C1s spectrum of the GONRs.
Normal force dependences of friction on GONRs, N-GNRs, and K-GNRs in (a) ambient condition, (b) dry nitrogen condition. (c) Thickness independent friction on GONRs in the ambient condition, 3 random data set with different sample thicknesses. (d) Adhesion force for all types of graphene nanoribbons in ambient and low humidity conditions.
The AFM tip profile before (a) and after (b) friction testing in a typical experiment.
The thickness measurement of GNRs.
High-resolution XPS results of nanoribbons. N/A indicates an atomic concentration of <0.1% was detected by XPS.
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