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Aluminium doped —A transparent conducting oxide with tunable optical and electrical properties
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View: Figures


Image of FIG. 1.
FIG. 1.

(a) X-ray diffraction patterns of :Al for various magnesium content (x). (b) Confirmation of the incorporated amount of Mg and Al measured by XPS.

Image of FIG. 2.
FIG. 2.

(a) Model dielectric function fitted to measured multiple angle ellipsometric measurements. The change in the band gap position is clearly seen, as well as the reduction of the refractive index in the transparent region. (b) Dependency of the refractive index n at 2 eV (◼), 1D oscillator position (•), and band gap ( ) on Mg content.

Image of FIG. 3.
FIG. 3.

Overview of the main electrical properties of :Al as a function of Mg content. (a) The reduction in the work function as measured by the secondary electron cut off in UPS measurements (◼). (b) The measured change in resistivity ( ) and effective carrier activation energy (▴). As reference resistivities of chemical vapour deposited material (from Ref. 13 ) are shown as well ( ). (c) Mobility (▾) and carrier concentration ( ) for selected samples. (d) Schematic summary of changes in the band structure consistent with all the measurements presented.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Aluminium doped Zn1−xMgxO—A transparent conducting oxide with tunable optical and electrical properties