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(a) XRD θ-2θ scan of Co20Fe50Ge30 (20 nm) film on MgO (001). (b) Φ scan on the Co20Fe50Ge30 (20 nm) sample. The red line represents data taken at 2θ of 44.66° (CoFeGe (022) peak) and the black one represents data taken at 62.45° (MgO (022) peak).
In-plane (black) and out-of-plane (red) magnetic hysteresis loops for (a) 1.2 nm and (b) 2 nm annealed Co20Fe50Ge30 films, respectively.
Saturation magnetization Ms (emu/cc) (red) and magnetization per unit area ms (emu/cm2) (blue) vs the CoFeGe film thickness at 300 K.
The dependence of total perpendicular anisotropy K on film thickness, plotted as the product of K and thickness vs. thickness.
In-plane (black) and out-of-plane (red) hysteresis loops for the annealed sample of MgO(001)/CoFeGe (1.0 nm)/MgO (2.0 nm)/Ta(5 nm).
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