Full text loading...
(a) Perspective view of the distorted orthorhombic structure of TbMnO3. (b) and (c) XRD patterns for the 40 nm TMO films on LAO and STO substrates, respectively. The insets show the schematic model of epitaxial relationship between the films and substrates, respectively. (d) φ-scan around LAO (111) and TMO (111) reflections. (e) φ-scan around STO (222) and TMO (222) reflections.
Temperature dependent magnetization under ZFC condition with a 200 Oe measurement field, perpendicular to (out-plane  (a)) and parallel to (in-plane [−110] and  (b)) surface of TMO film on LAO substrate, perpendicular to (out-plane  (c)) and parallel to (in-plane [−110] and  (d)) surface of TMO film on STO substrate. Left and right insets of (b) are the second measurement  M/T curve and the enlarged 120 K transition, separately. Inset of (c) is the enlarged 10 K transition. Inset of (d) is the coherence sketch of the domain of TMO film with STO substrate.
Magnetization vs temperature plots of TMO film on LAO substrate measured along film  orientation under ZFC and FC conditions of 200 Oe and 2000 Oe, respectively. Inset is Magnetization versus magnetic field (H) at 5 K and the nested inset is the enlarged M-H.
Magnetization measured on the TMO film grown on STO substrate, (a) Magnetization versus magnetic field (H) on  orientation at 5 K, and inset is the enlarged M-H. (b) Magnetization vs temperature plots on  orientation under ZFC and FC conditions of 200 Oe. (c) Magnetization vs temperature plots of TMO films with different thickness on STO substrates measured under ZFC condition with a 200 Oe measurement field along  direction. (d) Inverse susceptibility (χ−1) as a function of temperature.
The cross-section bright-field TEM micrographs of the 40-nm-thick TMO films grown on LAO (a) and STO (b) substrates, respectively.
Article metrics loading...