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Optical micrograph of a supercrystal film of magnetite NPs formed on a stationary Si substrate (with the wafer edge on top) by drying in the vacuum chamber during real-time SAXS measurements. A light, 1.5 mm wide streak is visible on the film where the x-ray beam is incident.
Optical micrograph of a Kapton film substrate with a supercrystal film formed during real-time SAXS measurements, with 20-s long exposures followed by substrate repositioning. (a) Indicated are the locations of seven of the 12 measured spots on this sample; Spots 6, 7, and 8, which correspond to the times where crystallization was observed in SAXS (see Fig. 4), are darkened. The space between dashed lines corresponds to 2 mm. The film formed on a Si substrate looks similar. (b) High-magnification, 1-mm wide micrograph of Kapton film substrate showing the discolored region of Spot 8 (on the left) and unexposed region (on the right).
SEM micrograph of a Si substrate with a supercrystal film formed during real-time SAXS measurements, with 20-s long exposures followed by substrate repositioning. Image (a) compares regions without x-ray irradiation (left in (a), expanded in (b)) and with x-ray irradiation (right in (a), expanded in (c)), which has smaller SC domains, with ∼1 μm lateral dimension.
SAXS in transmission for several of the spots shown in Fig. 2, with Spot 5 before, Spots 7 and 8 during, and Spot 10 after drying of the NP film. fcc ordering is seen in Spots 8 and 10.
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