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Atomic force microscopy characterization results. (a) Two dimensional TR-TUNA® profile at −2 V bias; (b) Superimposed topography-current profiles along the marked cut.
Experimental J-V characterization results (experimental I-V results normalized to the contact area). The experimental data points are superimposed with simple exponential fits (represented by lines).
Calculated conduction band profile of In/Cd0.9Zn0.1Te interfaces for two contact sizes, 10 nm and 30 nm radii.
Experimental current density results fitted to field emission (one dimensional Schottky) model.
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