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Microstructural and ferromagnetic resonance properties of epitaxial nickel ferrite films grown by chemical vapor deposition
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10.1063/1.4754847
/content/aip/journal/apl/101/13/10.1063/1.4754847
http://aip.metastore.ingenta.com/content/aip/journal/apl/101/13/10.1063/1.4754847
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

TEM images from NFO grown on (100)-oriented MgAl2O4 substrate showing microstructural defects present in the film. (a) Bright field TEM image with g = 〈220〉, presence of threading dislocations and dark diffused contrast can be observed, (b) HRTEM image and (c) Fourier filtered image with g = 〈004〉 showing formation of misfit dislocations.

Image of FIG. 2.
FIG. 2.

(a) FMR resonance field and (b) linewidth at different microwave frequencies and static field orientations.

Image of FIG. 3.
FIG. 3.

Angular and frequency dependence of (a) FMR resonance field and (b) linewidth. The inset in (b) shows the in-plane and out-of-plane FMR curves measured at 10 GHz.

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/content/aip/journal/apl/101/13/10.1063/1.4754847
2012-09-25
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Microstructural and ferromagnetic resonance properties of epitaxial nickel ferrite films grown by chemical vapor deposition
http://aip.metastore.ingenta.com/content/aip/journal/apl/101/13/10.1063/1.4754847
10.1063/1.4754847
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