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XRD patterns of YSZ and Mn-YSZ samples. The dotted lines have been included to show the peak shifts.
(a) XRD patterns of Mn-YSZ samples annealed at 1400 °C for 72 h along with Reitveld refined pattern. The measured and calculated patterns are shown, with the calculated tetragonal and cubic zirconia contributions. (b) In situ XRD patterns of Mn-YSZ mixed power samples.
SEM image of Mn-YSZ surface thermally treated at 1400 °C.
AFM images (Z = 250.0 nm) of Mn-YSZ samples thermally treated at (a) 1250 °C, (b) 1400 °C, and (c) 1400 °C in 3D. (d) Line profiles of the Mn-YSZ surfaces.
TEM images of along with SAED diffraction patterns of Mn-YSZ sample thermally treated at 1400 °C: (a) Image, (b) SAED diffraction pattern of a grain, (c) SAED diffraction pattern of a grain boundary.
Refined lattice constants for the cubic zirconia phase as a function of annealing time for mixed Mn-YSZ powders (MnO2: YSZ weight ratio = 1:1).
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