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(a) Circularly polarized x-ray absorption spectra acquired from Cu(100)//Pn(1.8 nm)/Co(0.9 nm) structure. The difference of two spectra recorded at opposite helicity (+s, −s) provides a clear dichroism at Co (marked as A) and (marked as B) resonances. XMCD is able to facilitate the domain imagining as illustrated in the figure inset. (b) and (c) XMCD-based Co images taken with opposite photon polarizations. Clear contrast reversal occurs in selected regions. (d) PEEM image recorded at the C K-edge. (e) XMCD-based image recorded at the same location as in (d). Only regions free of C signals show the polarization dependence.
(a) Co L-edge spectra recorded from Cu(100)//Co (0.18 nm) and Cu(100)/Pn(8 nm)/Co(0.18 nm). The differences in (integrated) spectral intensity and width of resonance were observed. The background of absorption spectra was removed. (b) Depositing the same quantity of Co on three Pn films of thickness 10, 15, and 20 nm, respectively, we detected smaller integrated electron yields from structures with thicker Pn. The full width at half maximum (FWHM) of resonance measured on Pn/Co structures are larger than that of Cu(100)//Co.
(a) XMCD-based Co image taken from Cu(100)//Pn(3.6 nm)/Co(1.6 nm) near 300 K. Only regions free of Pn coverage show magnetic contrast (horizontal arrow). (b) and (c) Imaging the same area at 198 K, the areas corresponding to Pn/Co were able to show a dependence on photon polarization (vertical arrow). (d) Different but observable domains were detected over the entire Co film at room temperature after theaddition of Cu buffer layer. (e) The introduction of a 3.6-nm Cu buffer layer significantly improves the Co's spectral intensities and resonance widths.
(a) Linearly polarized NEXAFS spectra acquired from Si(100)///Pn(8 nm) structures capped with either Co(0.18 nm) or Cu(0.18 nm). The distinct electronic structure seen in the C K-edge spectra indicates that Pn responds strongly upon the deposition of Co layer (sold line), but is insensitive to the presence of the Cu layer (dotted line). (b) With or without a Pn bottom layer, the normalized L-edge spectra of the Cu top layer show no significant variation.
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