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(a) Infrared transmittance of the VACNT samples measured at normal incidence, along with that of the reference substrate (d = 0). The calculated transmittance using thin SiO2 films on the Si wafer is also shown for comparison. (b) Directional-hemispherical reflectance of the VACNT samples measured at 6° incidence angle in the visible and near-infrared regions.
Illustration of the ratio method for deducing the transmittance of the CNT film: (a) transmittance and reflectance of the actual structure of the sample; (b) transmittances and reflectances of the CNT film and substrate, respectively, when the CNT film is separated from the substrate by air.
Absorption coefficients of three VACNT films showing both the experimental results and the best fitting from the EMT (by varying x).
SEM images of the VACNT films: (a),(b) 10 μm, (c) 36 μm, and (d) 45 μm. All images are for side view, except that (b) is the top view.
The effective refractive index and extinction coefficient for ordinary waves predicted by EMT with different x values.
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