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Crystal structure of Y x Al y B14.
(a) Powder XRD pattern of Y x Al y B14 (x ∼ 0.57) after SPS treatment, and Al occupancy dependence on the (b) SPS sintering temperature (for the samples originally sintered in Ar at 1400 °C) and (c) sintering temperature (for the samples originally sintered in vacuum).
Temperature dependence of electrical resistivity of Y x Al y B14 (x ∼ 0.57). The logarithmic ρ is plotted versus T −0.25.
Temperature dependence of the Seebeck coefficient (a) plotted versus T 0.5 and effect of Al occupancy y on the Seebeck coefficient measured at 1000 K.
Temperature dependence of the (a) power factor, PF; (b) thermal conductivity, κ; and (c) ZT. The estimated minimum thermal conductivity Λmin (Ref. 23) is also plotted.
Details of synthesis of the Y x Al y B14 sample fabricated through SPS treatment.
The number of valence electrons from Y and Al atoms.
Characteristic temperature and γ coefficient of specific heat in Y x Al y B14.
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