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FE-SEM images of (a) NiO-based NWs embedded into AAO template; (b) x-ray diffraction patterns of the monolithic NiO (top panel) and multi-layer NiO/Pt NWs (bottom panel) after being oxidized in air ambient at 800 °C for 6 h.
TEM images of (a) monolithic NiO NWs, (b) multilayered NiO/Pt NWs with tNiO ∼ 50 nm, and (c) multilayered NiO/Pt NWs with tNiO ∼100 nm.
(a) I-V curves of monolithic NiO NWs and multilayered NiO/Pt NWs with tNiO ∼ 50 nm (gray line). The blue, green, and orange curves depict positive SET, negative RESET, and positive SET processes, respectively, for monolithic NiO NWs. (b) Temperature dependence of resistance at LRS for monolithic NiO NWs measured at 0.5 V.
The cumulative probabilities of VSET and VRESET for monolithic NiO and multilayered NiO/Pt NW arrays with different tNiO.
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