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(a) TEM micrograph of the longitudinal-section of the composite wire (NbTi nanowires marked by “Nb”); Insert of (a) is the corresponding SAED pattern, (b) SEM micrograph of the transverse-section of the composite wire (bright lamellas: the cross sections of NbTi nanowires); Insert of (b) is TEM micrograph of the cross-section of NbTi nanowires, (c) 2-D high-energy x-ray diffraction pattern of the composite wire, the longitudinal L, and transverse T directions of the composite wire are labeled.
Multiple-step cyclic stress-strain curves of the NbTi-nanowire-NiTi composite wire.
(a) Section of diffraction patterns for the specimen at. 4% strain on the first loading, (b) and (c) the plots of the d-spacings for NbTi (110) and B2-NiTi (110) perpendicular to the wire axial direction versus the position in the entire specimen at three strain states in the first cycle.
The schematic representation of the superelastic memory mechanism in the composite. (a) Undeformed specimen, (b) The 1st load to 4% strain (The arrows represent the extended directions of martensitic transformation regions), (c) After the 1st unload (The arrows represent the interactional stresses between nanowires and matrix), (d) The 2nd load to 4% strain, and (e) The 2nd load to above 4% strain.
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