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(a) Schematic cross section of the sample and sketch of the illumination geometry. (b) Topography showing the different PEMA covered gold structures and the silicon reference area. (c) Optical amplitude image simultaneously acquired with topography. The white arrow marks the incidence direction of the light as well as the projection of its electric field on the sample plane. (d) Line profile of the optical amplitude along the black dashed line in (c).
Resonant triangle from Figure 1(c), illuminated with the incidence direction of the laser (white arrows) oriented along the three different axes.
(a) Sample sketch with indicated positions of evaluation: PEMA on (1) bright resonant corner, (2) gold substrate, (3) dark resonant corner, (4) silicon substrate. (b) Spectra of optical amplitude taken at positions marked in (a).
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