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Evolution of surface morphology and electronic structure of few layer graphene after low energy Ar+ ion irradiation
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10.1063/1.4767290
/content/aip/journal/apl/101/21/10.1063/1.4767290
http://aip.metastore.ingenta.com/content/aip/journal/apl/101/21/10.1063/1.4767290
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

AFM height images of FLG samples irradiated by 1 keV Ar+ energy at different sample tilt angles from 0° to 80°. The image in the middle is obtained from the un-irradiated FLG sample. The arrow indicates the Ar+ beam direction.

Image of FIG. 2.
FIG. 2.

FFT obtained from 1 μm × 1 μm AFM images after irradiating by 1 keV Ar+ energy at different sample tilt angles from 0° to 80°.

Image of FIG. 3.
FIG. 3.

(a) XPS spectra of FLG samples irradiated by 1 keV Ar+ energy at different sample tilting angles from 0° to 80°. (b) sp2/sp3 ratio as a function of 1 keV Ar+ ion irradiation tilt angles. (c) A hole and wavy FLG edge reconstruction (enclosed by a white rectangle). Inset of (c) across section profile of the hole after irradiation by 1 keV Ar+ energy at sample tilt angle of 80°.

Image of FIG. 4.
FIG. 4.

Variation of He I UPS valence-band spectra of the un-sputtered and the sputtered samples at irradiation tilt angles of 0°, 30°, 50°, and 70°. Inset is the DOS at vicinity of Fermi level.

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/content/aip/journal/apl/101/21/10.1063/1.4767290
2012-11-21
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Evolution of surface morphology and electronic structure of few layer graphene after low energy Ar+ ion irradiation
http://aip.metastore.ingenta.com/content/aip/journal/apl/101/21/10.1063/1.4767290
10.1063/1.4767290
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