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The suppressed negative bias illumination-induced instability in In-Ga-Zn–O thin film transistors with fringe field structure
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10.1063/1.4767996
/content/aip/journal/apl/101/22/10.1063/1.4767996
http://aip.metastore.ingenta.com/content/aip/journal/apl/101/22/10.1063/1.4767996
/content/aip/journal/apl/101/22/10.1063/1.4767996
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/content/aip/journal/apl/101/22/10.1063/1.4767996
2012-11-26
2014-11-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: The suppressed negative bias illumination-induced instability in In-Ga-Zn–O thin film transistors with fringe field structure
http://aip.metastore.ingenta.com/content/aip/journal/apl/101/22/10.1063/1.4767996
10.1063/1.4767996
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