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(a) XRD specular linear scans from LBSO/MgO heterostructures at different La contents (from x = 0 to 0.20). (b) The Ф scans pattern of the LBSO films and MgO substrate around (202) reflections. (c) Out-of-plane lattice parameters of LBSO films grown on MgO(001) substrates as a function of La doping content x, the error bars represent the standard deviation calculated based on XRD (00 l) peaks position.
AFM images of LBSO films grown on MgO(001) substrates with La content at (a) x = 0, (b) x = 0.02, (c) x = 0.05, (d) x = 0.07, (e) x = 0.10, (f) x = 0.15, and (g) x = 0.20.
Temperature-dependent resistivity from the LBSO films with La content at (a) x = 0.02, (b) x = 0.05, (c) x = 0.07, (d) x = 0.10, (e) x = 0.15, and (f) x = 0.20. The right to figures (a)-(e) shows the linear fit of ρ vs lnT, and the right to figure (f) is the linear fit of lnρ vs T −1/4.
(a) Optical transmission of pure MgO substrate and the LBSO/MgO heterostructures at different La contents. (b) (hvα)2 versus hv plots of LBSO/MgO(001) films (x = 0-0.20), and the inset shows the band gaps of LBSO films, the error bars originate in the uncertainty in the extrapolation of the absorption curves down to the base line.
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