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Nanoscale specific heat capacity measurements using optoelectronic bilayer microcantilevers
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10.1063/1.4772477
/content/aip/journal/apl/101/24/10.1063/1.4772477
http://aip.metastore.ingenta.com/content/aip/journal/apl/101/24/10.1063/1.4772477
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Figures

Image of FIG. 1.
FIG. 1.

(top) Deflection noise density of 100 μm and 200 μm long U shaped BMCs in air. The solid line represents a Sader fit. (bottom) Scanning electron microscope (SEM) images of 100 μm and 200 μm BMCs showing a sample platform area of 25 μm × 25 μm and 50 μm × 50 μm, respectively. Insets show microscope images of electrode patterns for resistance measurements.

Image of FIG. 2.
FIG. 2.

(a) Calibration data showing voltage ramp (0.01 V step) and measured temperature for a 200 μm BMC in air. Ten data points are collected at each step and averaged. A four point probe resistance measurement is conducted simultaneously to compare resistance to temperature. (b) Experimental temperature vs. resistance data in air are fit by a 4th order polynomial to determine the TCR. (c) SEM image of Al NP sample deposition ( ) on the backside of the sample platform area. (d) SEM image of Al NP on surface, indicating an average particle size of 100 nm.

Image of FIG. 3.
FIG. 3.

(a) Change in temperature vs. time after theapplication of a 25 ms current pulse in vacuum. (b)The heating rate (dT/dt) vs. temperature in vacuum. (c)Apparent heat capacity of the bare microcantilever chip and Al NP sample chip. (d) Specific heat capacity of Al NP ( ). 17

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/content/aip/journal/apl/101/24/10.1063/1.4772477
2012-12-12
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Nanoscale specific heat capacity measurements using optoelectronic bilayer microcantilevers
http://aip.metastore.ingenta.com/content/aip/journal/apl/101/24/10.1063/1.4772477
10.1063/1.4772477
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