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Photoelectric heat effect induce instability on the negative bias temperature illumination stress for InGaZnO thin film transistors
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10.1063/1.4772485
/content/aip/journal/apl/101/25/10.1063/1.4772485
http://aip.metastore.ingenta.com/content/aip/journal/apl/101/25/10.1063/1.4772485
/content/aip/journal/apl/101/25/10.1063/1.4772485
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/content/aip/journal/apl/101/25/10.1063/1.4772485
2012-12-17
2014-10-30
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Photoelectric heat effect induce instability on the negative bias temperature illumination stress for InGaZnO thin film transistors
http://aip.metastore.ingenta.com/content/aip/journal/apl/101/25/10.1063/1.4772485
10.1063/1.4772485
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