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Determination of Schottky barrier profile at Pt/SrTiO3:Nb junction by x-ray photoemission
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10.1063/1.4772628
/content/aip/journal/apl/101/25/10.1063/1.4772628
http://aip.metastore.ingenta.com/content/aip/journal/apl/101/25/10.1063/1.4772628
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

I-V curve at Pt/SrTiO:Nb junction with different Nb concentrations.

Image of FIG. 2.
FIG. 2.

XPE spectra in valence band and Ti 2p range of naked SrTiO:Nb surface and Pt/SrTiO:Nb structures. SXPE and HXPE denote XPE excited by soft x-ray (AlKα) and hard x-ray (6 keV), respectively. Numbers in wt. % show Nb-doping concentrations in SrTiO:Nb crystal.

Image of FIG. 3.
FIG. 3.

Illustration of XPE profile simulation.

Image of FIG. 4.
FIG. 4.

Potential distribution ( ()) at Pt/SrTiO:Nb junction (a) determined by entering parameters shown here into Eq. (5) and Ti 2 p XPE profile (b) simulated by entering () and various IMFPs into Eq. (4) .

Image of FIG. 5.
FIG. 5.

Observed and simulated HXPE profiles. Solid lines and dots show simulated and observed XPE values, respectively. Inset shows potential profile in SrTiO:Nb determined by entering φ and values shown here into Eq. (5) .

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/content/aip/journal/apl/101/25/10.1063/1.4772628
2012-12-20
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Determination of Schottky barrier profile at Pt/SrTiO3:Nb junction by x-ray photoemission
http://aip.metastore.ingenta.com/content/aip/journal/apl/101/25/10.1063/1.4772628
10.1063/1.4772628
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