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A series of representative full-field XANES images from the TXM at NSLS demonstrate the unique TXM capability. The magnification at various energies is kept constant via automated adjustment of the detector position and therefore preserves the best resolution of this instrument.
The absorption spectra of the Ni, NiO, and Ni2O3 near the Ni absorption K-edge (8333 eV). Three tomography measurements were carried out at 8300, 8348, and 8375 eV, labeled in the figure as Tomo1: E8300, Tomo 2: E8348, and Tomo 3:E8375, respectively.
TXM 2D projections of the NiO-decorated Ni-YSZ sample taken at the x-ray energies of (a) 8300, (b) 8348, and (c) 8375 eV. The NiO reference powders are indicated by arrows in the figures.
(a) 3D reconstruction of the Ni-YSZ anode sample from E8375 with the decorated NiO powder, indicated by an arrow (red online). The cross-section of the NiO powder is shown at the location indicated by the dash line (red online) at various x-ray energies: (b) 8300, (c) 8348, and (d) 8375 eV.
The reconstructed virtual cross-section image of the SOFC sample is shown at the location indicated in Figure 4(a) by the solid line (green online) at various x-ray energies. (a) E8300, (b) E8348, (c) E8375 eV, and (d) the difference between E8348 and E8375 shows merely noise levels.
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