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(a) Idealized device structure of the LL processed devices. (b) Structure of the traditional BHJ devices.
Device performance on P3HT and ICBA film thicknesses.
J-V curves of (a) PCBM and ICBA based devices and (b) PC70BM and IC70BA based devices. (c) Dark J-V curves.
EQE curves of the LL processed devices.
Parameters for the P3HT/ICBA devices with various P3HT and ICBA film thicknesses.
Parameters for the optimized LL processed and traditional BHJ devices.
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