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Raman spectra for the ZnO single crystal (a) and AZO film with 0.5% Al (b) recorded in backscattering geometry along the  direction under different excitations, and Raman spectrum of the fused quartz substrate under 325 nm excitation (c).
Raman spectra of the ZnO single crystal, the undoped ZnO film, and the Al-doped ZnO films with different Al compositions under 325 nm excitation, after baseline subtraction. The vertical dashed line at 572 cm−1 is guide the eye.
Calculated line shapes with the IIF (solid line), CDF (dashed line), and DP + EO (dotted line) mechanisms for qmax = 5 qTF (a). Calculated line shapes with the IIF mechanism at different cutoff wave-vectors (b). Parameters of the AZO film with 1.0% Al are used for the calculations.
Line shape fitting results for the AZO films. Solid lines are the calculated spectra, and dotted lines are experimental data.
Electronic properties of the samples in this study.
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