Full text loading...
Reverse IV characteristics of 200 A JBSDs: (a) sample A with nano-scale pits and (b) sample B without pits.
Emission microscopy images corresponding to leakage points in 200 A SBDs: (a) sample A with nano-scale pits and (b) sample B without pits. The scales in (a) and (b) are same.
Surface morphology of sample A with nano-scale pits in Fig. 2(a): (a) high sensitivity emission microscopy image, (b) optical micrograph, and (c) AFM image at point 1 in (a).
Surface morphology of sample B without nano-scale pits measured by AFM in Fig. 2(b): (a) point A, (b) point B, and (c) point C.
Comparison of theoretical reverse IV curves with and without nano-scale pits. These data are referenced from Ref. 20.
Article metrics loading...