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Thermo-optic coefficient of silicon at 1550 nm and cryogenic temperatures
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The thermo-optic coefficient of silicon was measured at 1550 nm in the wide temperature range from 5 K to 300 K. For this purpose an interferometric measurement scheme was applied using the silicon sample as a Fabry-Perotetalon. The high resolution of this setup revealed a thermo-optic coefficient as low as at 5 K. The presented results show an excellent agreement with former measurements above 30 K including a value of at 300 K.
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