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Internal resonance based sensing in non-contact atomic force microscopy
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10.1063/1.4739416
/content/aip/journal/apl/101/5/10.1063/1.4739416
http://aip.metastore.ingenta.com/content/aip/journal/apl/101/5/10.1063/1.4739416
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Definition sketch of the two-field AFM cantilever—side (top) and top view (bottom).

Image of FIG. 2.
FIG. 2.

(Left) Natural-frequencies vs. κ for α = 1/2, β = 0.2 ωn n = 1,2 (red solid), 3.0*ωn (blue dashed-point), 3.4*ω1 (green dashed). (Right) Frequency ratio ω21 vs. β for α = 1/2, κ = 6.

Image of FIG. 3.
FIG. 3.

Escape threshold curves for Q1 = 45: ω21 = 3.4 (blue solid), ω21 = 2.0 (red dashed-dotted), ω21 = 3.0 (black dashed) and regions for quasiperiodic signals with ω21 = 3.4 (inset).

Image of FIG. 4.
FIG. 4.

Response of the nonlinear system for ω21 = 3.4, Q1 = 45, Q2 = 150, (left)  = 3.4,  = 0.0017, (right)  = 4.1,  = 0.0137.

Image of FIG. 5.
FIG. 5.

Quasi-periodic response for Q1 = 45, Q2 = 150, ω21 = 3.0: (left)  = 3.2,  = 0.0066, (right)  = 3.7,  = 0.02.

Image of FIG. 6.
FIG. 6.

Quasi-periodic response for Q1 = 45, Q2 = 150, ω21 = 2.0: (left),  = 2.2,  = 0.0091, (right)  = 2.7,  = 0.0205.

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/content/aip/journal/apl/101/5/10.1063/1.4739416
2012-07-30
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Internal resonance based sensing in non-contact atomic force microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/101/5/10.1063/1.4739416
10.1063/1.4739416
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