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Transversal magneto-resistance in epitaxial Fe3O4 and Fe3O4/NiO exchange biased system
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10.1063/1.4739951
/content/aip/journal/apl/101/5/10.1063/1.4739951
http://aip.metastore.ingenta.com/content/aip/journal/apl/101/5/10.1063/1.4739951
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Figures

Image of FIG. 1.
FIG. 1.

RHEED images of (a), UHV annealed MgO substrate (b), 15 nm NiO(001) grown on MgO (001) (c), after growth of 10 nm Fe3O4(001) on NiO/MgO. The images were recorded in (100) azimuth. (d) Schematic of the Hall bar used for the transversal MR measurements (see Ref. 6).

Image of FIG. 2.
FIG. 2.

Transversal MR vs magnetic field at 300 K, measured at different angles for 10 nm Fe3O4 (a) and Fe3O4/NiO bilayer (b). For comparison with the transversal MR measured at θ = 00, magnetization vs field measurements along [100] direction for both systems are also shown in (c) and (d).

Image of FIG. 3.
FIG. 3.

Bias dependence of the longitudinal (V xx ) and transversal voltage (V xy ) for both systems under a 1 T magnetic field. (a)-(c) 10 nm Fe3O4/MgO, (e)-(g) 10 nm Fe3O4/NiO/MgO. The bias dependence of the transversal MR for a magnetic field of 1 Tesla for Fe3O4/MgO (d) and 10 nm Fe3O4/NiO/MgO (h).

Image of FIG. 4.
FIG. 4.

Magnetic field dependence of the longitudinal and transversal MR measured at three current regions for (a)-(d) Fe3O4 film grown on MgO and (d)-(h) Fe3O4 film grown on NiO/MgO.

Image of FIG. 5.
FIG. 5.

Longitudinal and transversal MR as a function of θ under 1 T field measured at 200 K for (a) and (b) Fe3O4 film grown on MgO and (c) and (d) Fe3O4 film grown on NiO/MgO. The bias current is 0.002 mA for both systems.

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/content/aip/journal/apl/101/5/10.1063/1.4739951
2012-07-30
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Transversal magneto-resistance in epitaxial Fe3O4 and Fe3O4/NiO exchange biased system
http://aip.metastore.ingenta.com/content/aip/journal/apl/101/5/10.1063/1.4739951
10.1063/1.4739951
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