1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Optical and defect properties of hydrothermal ZnO with low lithium contamination
Rent:
Rent this article for
USD
10.1063/1.4739515
/content/aip/journal/apl/101/6/10.1063/1.4739515
http://aip.metastore.ingenta.com/content/aip/journal/apl/101/6/10.1063/1.4739515

Figures

Image of FIG. 1.
FIG. 1.

PL at 4 K from (a) the Zn-polar and O-polar faces of low-Li HT ZnO compared to the Zn-polar face of conventional (normal) HT ZnO, and from (b) the O-polar face of low lithium HT ZnO with and without BGE.

Image of FIG. 2.
FIG. 2.

TOF SIMS depth profiles of conventional HT ZnO (O-polar face) annealed at 1100 °C. The profiles were collected in positive ion mode using 20 KeV C60+ to sputter (at ∼0.5 nm/s) and 25 keV Bi+ to analyse. The near-surface peak concentrations of Li/Al/Na are approx. 6 × 1018/1 × 1018/2 × 1016 cm−3 using the relative sensitivity factors published in Ref. 4.

Image of FIG. 3.
FIG. 3.

(a) Typical J-V characteristics of iridium oxide Schottky contacts on the Zn-polar and O-polar faces of low-Li HT ZnO compared to the Zn-polar face of conventional (normal) HT ZnO and (b) vs η plots for multiple Schottky contacts on the polar faces of low-Li HT ZnO (note: the barrier heights are not corrected for the image-force-effect which lowers by ∼70 meV on each face).

Image of FIG. 4.
FIG. 4.

TAS measurements on the Zn-polar and O-polar faces of low-Li HT ZnO showing the temperature dependence of C and G(ω)/ω using a fixed test signal frequency of 140 KHz. The bias for both (a) and (b) was zero.

Image of FIG. 5.
FIG. 5.

(a) DLTS spectra of the Zn-polar and O-polar faces of low-Li HT ZnO (rate window 200 Hz, t p = 1 ms) and (b) Arrhenius plot of the defect levels obtained from TAS and DLTS.

Tables

Generic image for table
Table I.

Electronic properties of defects detected by TAS and DLTS on the Zn-polar and O-polar faces of low-Li HT ZnO compared to those detected on the Zn-polar face of conventional HT ZnO (taken from Ref. 15).

Loading

Article metrics loading...

/content/aip/journal/apl/101/6/10.1063/1.4739515
2012-08-08
2014-04-18
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Optical and defect properties of hydrothermal ZnO with low lithium contamination
http://aip.metastore.ingenta.com/content/aip/journal/apl/101/6/10.1063/1.4739515
10.1063/1.4739515
SEARCH_EXPAND_ITEM