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A Josephson junction defect spectrometer for measuring two-level systems
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View: Figures


Image of FIG. 1.
FIG. 1.

(a) An optical image of device 1 showing aluminum wires forming a meandering inductor, , and an interdigital capacitor, , in parallel with a Josephson junction, all fabricated on a sapphire substrate. In the zoomed inset, the small rectangle of can be seen in the area of the top JJ wire. (b) An effective circuit schematic of the physical device. The ac excitation, , and magnetic flux bias, , are applied through the transmission line, which is inductively coupled to the resonator.

Image of FIG. 2.
FIG. 2.

The spectrum on top shows the JJDS response to magnetic flux bias with splittings evident at several frequencies with the inset showing that the spectrum is periodic with applied magnetic flux as expected. The bottom panel shows the resonant frequency at each flux bias point determined by fitting the transmission curve as in the inset. The data are divided into alternating sections of (•) and by the occurrence of splittings. Near one of these splittings, the curve is multi-valued and the splitting size is defined as the point of closest approach.

Image of FIG. 3.
FIG. 3.

(a) By integrating the density of splittings versus the splitting size, we obtain the expected logarithmic dependence below the maximum splitting size. The maximum value is set by the total capacitance of the circuit. (b) A close-up of one splitting with excitation energy found to be photons. (c) After increasing the input power 100×, the splitting can no longer be resolved.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: A Josephson junction defect spectrometer for measuring two-level systems