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Physical insight into reduced surface roughness scattering in strained silicon inversion layers
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10.1063/1.4742772
/content/aip/journal/apl/101/7/10.1063/1.4742772
http://aip.metastore.ingenta.com/content/aip/journal/apl/101/7/10.1063/1.4742772
/content/aip/journal/apl/101/7/10.1063/1.4742772
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/content/aip/journal/apl/101/7/10.1063/1.4742772
2012-08-14
2014-12-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Physical insight into reduced surface roughness scattering in strained silicon inversion layers
http://aip.metastore.ingenta.com/content/aip/journal/apl/101/7/10.1063/1.4742772
10.1063/1.4742772
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