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Enhancement of perpendicular magnetic anisotropy thanks to Pt insertions in synthetic antiferromagnets
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10.1063/1.4745924
/content/aip/journal/apl/101/7/10.1063/1.4745924
http://aip.metastore.ingenta.com/content/aip/journal/apl/101/7/10.1063/1.4745924
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Out-of-plane hysteresis loops of SAF with tRu = 0.7 nm and Pt insertions of varying thickness. A clear increase of HRu can be observed when 0.2 nm of Pt is inserted. Moreover, the increase of coercivity and squareness ratio of the minor loops indicate an increase of PMA. The dashed lines denote the interlayer coupling fields HRu.

Image of FIG. 2.
FIG. 2.

Evolution of the effective anisotropy Keff of the top (Co/Pt) multilayer (a) and of the RKKY coupling constant ARU (b) as a function of the Pt insertion thickness for tRu = 0.7 nm in the as deposited state.

Image of FIG. 3.
FIG. 3.

Evolution of the RKKY coupling ARu as a function of tRu and tPt for as-deposited samples. Clear oscillations can be observed as a function of tRu, while the insertion of the Pt layer decreases the amplitude of these oscillations and shifts their position. The dashed lines underline the shift of the first and third peaks maxima as a function of the Pt insertion thickness.

Image of FIG. 4.
FIG. 4.

Evolution of ARu as a function of tRu and annealing temperature with a single Ru spacer (black symbols) and a composite Ru/Pt spacer (red symbols).

Image of FIG. 5.
FIG. 5.

Out-of-plane hysteresis loops of SAF reference layers with a single Ru spacer (black points) or a composite Ru/Pt spacer (red triangles) annealed at 300 °C. The open symbols correspond to the top (Co/Pt)/CoFeB multilayer reversal. The arrows denote the field at which the top multilayer starts to rotate.

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/content/aip/journal/apl/101/7/10.1063/1.4745924
2012-08-17
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Enhancement of perpendicular magnetic anisotropy thanks to Pt insertions in synthetic antiferromagnets
http://aip.metastore.ingenta.com/content/aip/journal/apl/101/7/10.1063/1.4745924
10.1063/1.4745924
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