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Structural and morphological properties of a YIG/HEAN/Cu/HEAN sample. (a) Cross-section SEM image. (b) Cross-section EDS image. (c) Surface SEM image. (d) Surface AFM image.
Graph (a) shows the XRD spectrum of a YIG/HEAN/Cu/HEAN sample. Graph (b) shows the (444) peak in (a) in an expanded angle scale. Graph (c) shows the spectrum in (b) in expanded angle and intensity scales. Graph (d) shows the XRD rocking curve for the (444) K α1 peak in (b). Graph (e) shows the XRD rocking curve for the (444) K α1 peak of a GGG wafer.
Magnetic hysteresis loop measured with a magnetic field applied in the film plane.
The circles in (a) and (b) show the same FMR data measured at 9.45 GHz. The circles in (c) show the FMR data measured at 17.3 GHz. The curves in (a) and (c) show Lorentzian fits, while the curve in (b) shows a Gaussian fit. In (d), the circles and curves show the experimental and theoretical FMR fields, respectively.
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