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Crystalline garnet Bragg reflectors for high power, high temperature, and integrated applications fabricated by multi-beam pulsed laser deposition
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10.1063/1.4748107
/content/aip/journal/apl/101/8/10.1063/1.4748107
http://aip.metastore.ingenta.com/content/aip/journal/apl/101/8/10.1063/1.4748107
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Measured spectrum of a 67 layer quarter-wave stack with fit from MATLAB model for comparison.

Image of FIG. 2.
FIG. 2.

Measured spectrum of a 145 layer quarter-wave stack with fit from MATLAB model for comparison.

Image of FIG. 3.
FIG. 3.

X-ray diffraction spectrum of an example stack (145 layers). Only (400) and (800) peaks can be observed, indicating that the film was epitaxially orientated.

Image of FIG. 4.
FIG. 4.

Transmission spectrum of a π phase-shifted stack showing the characteristic increase in transmission at ∼890 nm, in the centre of the main peak.

Image of FIG. 5.
FIG. 5.

Transmission spectra of apodized and quarter-wave stacks. Side bands are clearly suppressed in the apodized case.

Image of FIG. 6.
FIG. 6.

Partial x-ray diffraction spectrum of an apodized sample showing (400) contributions from each of the mixed layers (ratios labelled) as well as the underlying YAG substrate.

Image of FIG. 7.
FIG. 7.

Spectra of a quarter-wave stack before and after annealing in argon for 1 h at ∼1000 °C.

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/content/aip/journal/apl/101/8/10.1063/1.4748107
2012-08-24
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Crystalline garnet Bragg reflectors for high power, high temperature, and integrated applications fabricated by multi-beam pulsed laser deposition
http://aip.metastore.ingenta.com/content/aip/journal/apl/101/8/10.1063/1.4748107
10.1063/1.4748107
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