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Measured spectrum of a 67 layer quarter-wave stack with fit from MATLAB model for comparison.
Measured spectrum of a 145 layer quarter-wave stack with fit from MATLAB model for comparison.
X-ray diffraction spectrum of an example stack (145 layers). Only (400) and (800) peaks can be observed, indicating that the film was epitaxially orientated.
Transmission spectrum of a π phase-shifted stack showing the characteristic increase in transmission at ∼890 nm, in the centre of the main peak.
Transmission spectra of apodized and quarter-wave stacks. Side bands are clearly suppressed in the apodized case.
Partial x-ray diffraction spectrum of an apodized sample showing (400) contributions from each of the mixed layers (ratios labelled) as well as the underlying YAG substrate.
Spectra of a quarter-wave stack before and after annealing in argon for 1 h at ∼1000 °C.
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