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Dielectric enhancement in amorphous TaxGe1−xOy thin films
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10.1063/1.4748158
/content/aip/journal/apl/101/9/10.1063/1.4748158
http://aip.metastore.ingenta.com/content/aip/journal/apl/101/9/10.1063/1.4748158
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

The variation in dielectric constant (black squares) and dissipation factor (tan δ, blue triangles) of TaxGe1−xOy as a function Ta cation fraction measured at 10 kHz. The dotted line represents the linear interpolation between endmember values. The uncertainty in is estimated to be , dominated by uncertainty in the ellipsometrically determined thickness.

Image of FIG. 2.
FIG. 2.

Refractive indices plotted as a function of Ta cation fraction. The dotted line represents the linear interpolation between endmember values.

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/content/aip/journal/apl/101/9/10.1063/1.4748158
2012-08-27
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Dielectric enhancement in amorphous TaxGe1−xOy thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/101/9/10.1063/1.4748158
10.1063/1.4748158
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