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Low-frequency critical current noise in Josephson junctions induced by temperature fluctuations
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10.1063/1.4749282
/content/aip/journal/apl/101/9/10.1063/1.4749282
http://aip.metastore.ingenta.com/content/aip/journal/apl/101/9/10.1063/1.4749282
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Temperature dependence of critical current. (a) Normalized measured critical current vs. temperature (dots). Solid line is Ambegaokar-Baratoff prediction fitted to the measured . (b) Normalized measured critical current sensitivity (dots). Solid line obtained by differentiating solid line in (a).

Image of FIG. 2.
FIG. 2.

Temperature and critical current noise for three settings of temperature controller. Typical 20 min time traces for the measured (a) temperature and (b) critical current variations at 0.4 K.

Image of FIG. 3.
FIG. 3.

Cross-correlation functions of the three temperature and critical current time series shown in Fig. 2.

Image of FIG. 4.
FIG. 4.

Cross-spectra and spectral densities. (a) Normalized cross-spectral density (coherence) vs. frequency for data runs A, B, and C. Green line is a single-pole filter with time constant of 3.5 s and asymptotic value of 0.95 at low frequencies. (b) Run C: spectral density of critical current variations and of temperature variations scaled to equivalent critical current variations.

Image of FIG. 5.
FIG. 5.

Critical current noise caused by charge-trapping compared to that due to temperature variations. For , we use values from Eqs. (1) and (2), whereas is calculated for Al and Nb assuming (a), (b), and (c). Here, and .

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/content/aip/journal/apl/101/9/10.1063/1.4749282
2012-08-30
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Low-frequency critical current noise in Josephson junctions induced by temperature fluctuations
http://aip.metastore.ingenta.com/content/aip/journal/apl/101/9/10.1063/1.4749282
10.1063/1.4749282
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